Electron heating in silicon dioxide and off-stoichiometric silicon dioxide films
- D.J. DiMaria
- T.N. Theis
- et al.
- 1985
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
The effect of gate metal and SiO2 thickness on the generation of donor states at the Si-SiO2 interface
- M.V. Fischetti
- Z.A. Weinberg
- et al.
- 1985
- Journal of Applied Physics
PaperLocalization and magnetic properties in cerium compounds
- J.L. Tholence
- P. Haen
- et al.
- 1985
- Journal of Applied Physics
PaperTransient capacitance study of electron traps in AlGaAs grown with As 2
- P.M. Mooney
- R. Fischer
- et al.
- 1985
- Journal of Applied Physics
PaperMicroloop measurements of recording head fields versus current
- Roger F. Hoyt
- 1985
- Journal of Applied Physics
PaperRelationship between beam and junction parameters in ion beam processed Josephson devices
- A.W. Kleinsasser
- 1985
- Journal of Applied Physics
PaperThe characterization of indium desorbed Si surfaces for low temperature surface cleaning in Si molecular beam epitaxy
- H.T. Yang
- P.M. Mooney
- 1985
- Journal of Applied Physics
PaperModel for a Josephson sampling gate
- B.J. Van Zeghbroeck
- 1985
- Journal of Applied Physics
PaperThermal stability of the Al/PdxW100-x/Si contact systems
- M. Eizenberg
- R.D. Thompson
- et al.
- 1985
- Journal of Applied Physics
PaperConductivity and magnetic properties of TmSe and TmS: Comparison to the dilute cases
- F. Holtzberg
- J. Flouquet
- et al.
- 1985
- Journal of Applied Physics
Review