On the Narrow-Emitter Effect of Advanced Shallow-Profile Bipolar Transistors
- G.P. Li
- C.T. Chuang
- et al.
- 1988
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Measurement of MOSFET Channel Potential Profile
- Yew-Tong Yeow
- 1988
- IEEE T-ED
PaperOxide-Thickness Determination in Thin-Insulator MOS Structures
- Bruno Ricco
- Piero Olivo
- et al.
- 1988
- IEEE T-ED
PaperInherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- Edward Hackbarth
- Denny Duan-Lee Tang
- 1988
- IEEE T-ED
PaperDevelopment and Experimental Verification of a Two-Dimensional Numerical Model of Piezoelectrically Induced Threshold Voltage Shifts in GaAs MESFET’s
- Jean-Claude Ramirez
- Patrick J. Mcnally
- et al.
- 1988
- IEEE T-ED
PaperThe Effect of Extrinsic Base Encroachment on the Switch-On Transient of Advanced Narrow-Emitter Bipolar Transistors
- C.T. Chuang
- 1988
- IEEE T-ED
PaperVIA-8 High-Performance GaInAs Interdigitated-Metal-Semiconductor-Metal (IMSM) 1.3-µm Photodetector Grown on a GaAs Substrate
- D.L. Rogers
- J. Woodall
- et al.
- 1987
- IEEE T-ED
PaperOn the Punchthrough Characteristics of Advanced Self-Aligned Bipolar Transistors
- C.T. Chuang
- Denny Duan-Lee Tang
- 1987
- IEEE T-ED
PaperIIA-2 Saturable Charge FET
- P. Solomon
- D.J. Frank
- et al.
- 1987
- IEEE T-ED
PaperA study of channel avalanche breakdown in scaled n-mosfet’s
- Steven E. Laux
- Fritz H. Gaensslen
- 1987
- IEEE T-ED
Paper