Dc conductivity and the Meyer-Neldel rule in a-Si:H
- Xiaomei Wang
- Y. Bar-Yam
- et al.
- 1988
- Physical Review B
Paper
Publications
26943 results for Science
First-overtone response in modulated photoluminescence emission in silicon at room temperature
- D. Guidotti
- J.S. Batchelder
- et al.
- 1988
- Physical Review B
PaperFractional quantization in ultranarrow electron channels
- T.P. Smith III
- K.Y. Lee
- et al.
- 1988
- Physical Review B
PaperHigh-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
- David W. Abraham
- Yves Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperThermal and photo thermal imaging on a sub 100 nanometer scale
- C.C. Williams
- H.K. Wickramasinghe
- 1988
- SPIE OE/LASE 1988
Conference paperAtomic force microscope: Implementations
- P.C.D. Hobbs
- Y. Martin
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperCreating and observing surface features with a scanning tunneling microscope.
- J. Schneir
- P.K. Hansma
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperSome history and technology of scanning microscopy
- H.K. Wickramasinghe
- 1989
- Proceedings of SPIE 1989
Conference paperScanning Near-Field Optical Microscopy (SNOM*): Basic Principles and Some Recent Developments
- U.C. Fischer
- U. Dürig
- 1989
- Proceedings of SPIE 1989
Conference paperElasto-plastic analysis of the peel test for thin film adhesion
- Kyung-Suk Kim
- Junglhl Kim
- 1988
- Journal of Engineering Materials and Technology, Transactions of the ASME
Paper