Calculation of postionization probabilities as a function of plasma parameters in electron gas secondary neutral mass spectrometry
- A. Wucher
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Publications
26943 results for Science
Tungsten-rhenium alloys as diffusion barriers between aluminum and silicon
- S.-E. Hörnström
- T. Lin
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperLow frequency collective excitations in the quantum-hall system
- E.Y. Andrei
- D.C. Glattli
- et al.
- 1988
- Surface Science
PaperPhonon density of states in YBa2Cu3Ox
- P. Strobel
- P. Monceau
- et al.
- 1988
- Physica C: Superconductivity and its applications
PaperMulti-purpose VLSI chip for adaptive data compression of bilevel images
- Ronald B. Arps
- Thomas K. Truong
- et al.
- 1988
- IBM J. Res. Dev
PaperAdsorption kinetics of SiH4, Si2H6 and Si3H8 on the Si(111)-(7×7) surface
- Stephen M. Gates
- 1988
- Surface Science
PaperImage Analysis Methods for Solder-Ball Inspection in Integrated Circuit Manufacturing
- W.E. Blanz
- Jorge L. C. Sanz
- et al.
- 1988
- IEEE Journal on Robotics and Automation
PaperHot electrons in SiO2: ballistic to steady-state transport
- M.V. Fischetti
- D.J. DiMaria
- 1988
- Solid State Electronics
PaperCalculations of STM linescans - general formalism
- Ş. Ellialtioǧlu
- S. Ciraci
- et al.
- 1988
- Solid State Communications
PaperMicrostructure of sputtered metal films grown in high and low pressure discharges
- E. Kay
- F. Parmigiani
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper