Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing
- Zeev Barzilai
- Don Coppersmith
- et al.
- 1983
- IEEE TC
Paper
Publications
314 results at IEEE TC
Analysis of a Local-Area Bus System with Controlled Access
- Werner Bux
- 1983
- IEEE TC
PaperDelayed-Staging Hierarchy Optimization
- Gabriel M. Silberman
- 1983
- IEEE TC
PaperOptimal Wiring of Movable Terminals
- Inder S. Gopal
- Don Coppersmith
- et al.
- 1983
- IEEE TC
PaperExhaustive Test Pattern Generation with Constant Weight Vectors
- Donald T. Tang
- Lin S. Woo
- 1983
- IEEE TC
PaperRedundancy and Don't Cares in Logic Synthesis
- Daniel Brand
- 1983
- IEEE TC
PaperGood Controllability and Observability Do Not Guarantee Good Testability
- Jacob Savir
- 1983
- IEEE TC
PaperAnalytic Queueing Models for Programs with Internal Concurrency
- Philip Heidelberger
- Kishor S. Trivedi
- 1983
- IEEE TC
PaperA Basis for the Quantitative Comparison of Computer Number Systems
- Shauchi Ong
- Daniel E. Atkins
- 1983
- IEEE TC
PaperA Validation Technique for Tightly Coupled Protocols
- Harry Rudin
- Colin H. West
- 1982
- IEEE TC
Paper