A Novel Scheme for Detection of Defects in III-V Semiconductors by Cathodoluminescence
- Larry M. Glassman
- Martin P. Scott
- 2019
- JES
Paper
Publications
509 results at JES
The Ion Sensitivity of Boron Implanted Silicon Nitride Chemical Sensors
- Yin Hu
- Marvin H. White
- 2019
- JES
PaperSelective dry etching of germanium with respect to silicon and vice versa
- G.S. Oehrlein
- T.D. Bestwick
- et al.
- 2019
- JES
PaperJet and Laser-Jet Electrochemical Micromachining of Nickel and Steel
- M. Datta
- L. Romankiw
- et al.
- 2019
- JES
PaperSidewall Spacer Technology for MOS and Bipolar Devices
- Sang H. Dhong
- Edward J. Petrillo
- 2019
- JES
PaperThe Effects of Pressure, Temperature, and Time on the Annealing of lonizing Radiation Induced Insulator Damage in N-channel IGFET's
- A. Reisman
- C.J. Merz
- 2019
- JES
PaperThe Mechanism of Electroless Cu Deposition: Extraction of the Oxidative and Reductive Electrochemical Half-Cell Currents from a Complete Bath
- O.R. Melroy
- 2019
- JES
PaperLaser-Assisted Etching of Manganese-Zinc-Ferrite
- Brian W. Hussey
- Arunava Gupta
- et al.
- 2019
- JES
PaperCorrosion and Passivation of Fe and FeN Films
- V. Brusic
- G.S. Frankel
- et al.
- 2019
- JES
PaperX-Ray Damage Considerations in MOSFET Devices
- J.R. Maldonado
- S.S. Iyer
- 2019
- JES
Paper