Ellipsometry and reflection, luminescence and Raman spectroscopies of monolayer assemblies on solid substrates
- W. Knoll
- J. Rabe
- et al.
- 1983
- Thin Solid Films
Paper
Publications
26878 results for Science
Rapid writing of fine lines in Langmuir-Blodgett films using electron beams
- A.N. Broers
- M. Pomerantz
- 1983
- Thin Solid Films
PaperExperimental HeAg(110) interaction potential
- R. Schinke
- A.C. Luntz
- 1983
- Surface Science
PaperAdvances in the design of organic resist materials
- Scott A. MacDonald
- Hiroshi Ito
- et al.
- 1983
- Microelectronic Engineering
PaperTheory of Invar and Heusler alloys
- A.R. Williams
- V.L. Moruzzi
- et al.
- 1983
- Journal of Magnetism and Magnetic Materials
PaperFine-grained base electrode process for Pb-alloy Josephson technology
- A.A. Bright
- S. Klepner
- 1983
- JVSTA
PaperNumbering binary trees with labeled terminal vertices
- F. James Rohlf
- 1983
- Bulletin of Mathematical Biology
PaperCzochralski bulk flow of silicon at large melt aspect ratio
- W.E. Langlois
- 1983
- Journal of Crystal Growth
PaperCircuit Analysis, Logic Simulation, and Design Verification for VLSI
- Albert E. Ruehli
- Gary S. Ditlow
- 1983
- Proceedings of the IEEE
PaperDetermination of the oxygen precipitate-free zone width in silicon wafers from surface photovoltage measurements
- Terry I. Chappell
- Patrick W. Chye
- et al.
- 1983
- Solid-State Electronics
Paper