The direct observation of atomic surface structure and inclined planar defects in Au(111) films
- William Krakow
- 1982
- Thin Solid Films
Paper
Publications
26877 results for Science
Comparison of the three classes (rare earth, refractory and near-noble) of silicide contacts
- R.D. Thompson
- K.N. Tu
- 1982
- Thin Solid Films
PaperComplexity of finding k-path-free dominating sets in graphs
- Reuven Bar-Yehuda
- Uzi Vishkin
- 1982
- Information Processing Letters
PaperElectron beam study of silicide Schottky diodes
- H.-C.W. Huang
- C.F. Aliotta
- et al.
- 1982
- Thin Solid Films
PaperSingle-site mixed valence of thulium: A comparative photoemission study of TmxY1-xSe and TmxY1-xS
- N. Mårtensson
- B. Reihl
- et al.
- 1982
- Physical Review B
PaperElectronic structure of silicide-silicon interfaces
- G.W. Rubloff
- P.S. Ho
- 1982
- Thin Solid Films
PaperLattice imaging of silicide-silicon interfaces
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
PaperAn X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces
- Haydn Chen
- G.E. White
- et al.
- 1982
- Thin Solid Films
PaperFormation and structure of epitaxial NiSi2 and CoSi2
- L.J. Chen
- J.W. Mayer
- et al.
- 1982
- Thin Solid Films
PaperAnalysis of high resolution electron microscope images of the Pd2Si-Si interface
- W. Krakow
- 1982
- Thin Solid Films
Paper