Correlation Between the Diffusive and Electrical Barrier Properties of the Interface in Polysilicon Contacted n+-p Junctions
- Johannes M.C. Stork
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Increasing the Current Driving Capability of Epitaxial Schottky-Barrier Diodes Using High-Energy Implantation
- C.T. Chuang
- G.P. Li
- et al.
- 1985
- IEEE T-ED
PaperStability and SER Analysis of Static RAM Cells
- Barbara Chappell
- Stanley E. Schustfr
- et al.
- 1985
- IEEE T-ED
PaperVA-5 Pseudomorphic GaInAs/GaAs Single Quantum Well High Electron Mobility Transistor
- J.J. Rosenberg
- M. Benlamri
- et al.
- 1985
- IEEE T-ED
PaperProbing the Minority-Carrier Quasi-Fermi Level in Epitaxial Schottky-Barrier Diodes
- Lawrence F. Wagner
- C.T. Chuang
- 1985
- IEEE T-ED
PaperTechniques for Small-Signal Analysis of Semiconductor Devices
- Steven E. Laux
- 1985
- IEEE T-ED
PaperA Fully Scaled Submicrometer NMOS Technology Using Direct-Write E-Beam Lithography
- Matthew R. Wordeman
- April M. Schweighart
- et al.
- 1985
- IEEE T-ED
PaperAn Analytical One-Dimensional Model for Lightly Doped Drain (LDD) MOSFET Devices
- Fang-Shi J. Lai
- Jack Yuan-Chen Sun
- 1985
- IEEE T-ED
PaperVA-6 Temperature-Dependent Properties of the Double HBJT
- S. Tiwari
- S.L. Wright
- et al.
- 1985
- IEEE T-ED
PaperVA-1 Measuring Barrier Heights in GaAs-AlGaAs and Metal-AlGaAs Junctions by Internal Photoemission
- M. Heiblum
- M.I. Nathan
- et al.
- 1985
- IEEE T-ED
Paper