Correlations of Photoluminescence with Defect Densities in Semi-Insulating Gallium Arsenide
- Harold J. Hovel
- D. Guidotti
- 1985
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Correlation Between the Diffusive and Electrical Barrier Properties of the Interface in Polysilicon Contacted n+-p Junctions
- Johannes M.C. Stork
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
PaperPerformance Limits of CMOS ULSI
- James R. Pfiester
- John D. Shott
- et al.
- 1985
- IEEE T-ED
PaperA General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport
- Steven E. Laux
- Bertrand M. Grossman
- 1985
- IEEE T-ED
PaperExperimental Study of the Minority-Carrier Transport at the Polysilicon—Monosilicon Interface
- Arnost Neugroschel
- Maurizio Arienzo
- et al.
- 1985
- IEEE T-ED
PaperAn Analytical One-Dimensional Model for Lightly Doped Drain (LDD) MOSFET Devices
- Fang-Shi J. Lai
- Jack Yuan-Chen Sun
- 1985
- IEEE T-ED
PaperIIIB-2 Channel Length Characterization of LDD MOSFET's-
- Jack Y. C. Sun
- Matthew R. Wordeman
- et al.
- 1985
- IEEE T-ED
PaperSwitch-On Transient of Shallow-Profile Bipolar Transistors
- Denny Duan-Lee Tang
- 1985
- IEEE T-ED
PaperVA-1 Measuring Barrier Heights in GaAs-AlGaAs and Metal-AlGaAs Junctions by Internal Photoemission
- M. Heiblum
- M.I. Nathan
- et al.
- 1985
- IEEE T-ED
PaperVA-6 Temperature-Dependent Properties of the Double HBJT
- S. Tiwari
- S.L. Wright
- et al.
- 1985
- IEEE T-ED
Paper