Dependence of the Flatband Voltage of Si-MOS on Distribution of Cesium in SiO2 Comparison of Two Implantation Methods
- L. Krusin-Elbaum
- 2019
- JES
Paper
Publications
24860 results for Exploratory Science
An XPS and TEM Study of Intrinsic Adhesion Between Polyimide and Cr Films
- N.J. Chou
- D.W. Dong
- et al.
- 2019
- JES
PaperTranspassive Dissolution of 420 Stainless Steel in Concentrated Acids under Electropolishing Conditions
- M. Datta
- D. Vercruysse
- 2019
- JES
PaperReactive Ion Etching of GaAs in Chlorine and Resulting Surface Damage
- B.S. Lee
- H. Baratte
- 2019
- JES
PaperInterfacial reaction between Ni and MBE-Grown SiGe alloy
- R.D. Thompson
- K.N. Tu
- et al.
- 2019
- JES
PaperElimination of End-of-Range Shallow Junction Implantation Damage during CMOS Titanium Silicidation
- G.A. Rozgonyi
- 2019
- JES
PaperComparison of Thermoluminescence and Phosphorescence between Electron-Excited and U.V.-Excited Zinc Silicate Phosphors
- Takeshi Takamori
- Derek B. Dove
- 2019
- JES
PaperOxidation of Plasma-Deposited α-SixC1-x:H Films
- J.M. Eldridge
- J.O. Moore
- et al.
- 2019
- JES
PaperDetermination of partial currents for cuni and cuco electrodeposition using rotating ring-disk electrodes
- Jean Horkans
- I-Chia Hsu Chang
- et al.
- 2019
- JES
PaperMnFe and NiFe Thin Films and Magnetic Exchange Bilayers
- Michael A. Russak
- S.M. Rossnagel
- et al.
- 2019
- JES
Paper