POST OXIDATION ANNEAL AND RE-OXIDATION EFFECTS IN 5 nm SiO//2 FILMS.
- L. Dori
- M. Arienzo
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- 1986
- MRS Fall Meeting 1986
Conference paper
Publications
3553 results for Materials Discovery
Corrosion basic reactions, tests, prevention
- V. Brusic
- 1987
- Annual Technical Conference of the Society of Vacuum Coaters 1987
Conference paperREACTIVE ION ETCHING OF MULTI-LAYER RESIST.
- H.Y. Ng
- D.P. Klaus
- et al.
- 1986
- MRS Fall Meeting 1986
Conference paperMoisture diffusion in electronic packages. I. Transport within face coatings
- L.T. Nguyen
- C.A. Kovac
- 1987
- International SAMPE Electronics Conference 1987
Conference paperREACTIVE ION ETCHING OF Al(Cu) ALLOYS.
- C.-K. Hu
- M.B. Small
- et al.
- 1986
- MRS Fall Meeting 1986
Conference paperConductive copolymers of alkylthiophenes and methylmethacrylate
- Wu-Song Huang
- Young H. Kim
- et al.
- 1987
- International SAMPE Electronics Conference 1987
Conference paperPolymer blends on electrodes
- J.C. Lacroix
- A. Diaz
- 1987
- International SAMPE Electronics Conference 1987
Conference paperCharacterization of epitaxial films by grazing-incidence X-ray diffraction
- Armin Segmüller
- 1987
- Thin Solid Films
PaperRelationship between substrate bias and microstructure in magnetron-sputtered AlCu films
- T. Lin
- K.Y. Ahn
- et al.
- 1987
- Thin Solid Films
PaperThe effect of ultrathin selenium overcoat on the stability of tellurium-based optical recording media
- W.-Y. Lee
- 1987
- Thin Solid Films
Paper