Summary Abstract: Reactive ion-etching-related Si surface residues and subsurface disorder
- G.S. Oehrlein
- J.G. Clabes
- et al.
- 1986
- JVSTA
Publications
3549 results for Materials Discovery
Schottky barrier heights of epitaxial Ni-silicides on Si(111)
- M. Liehr
- P.E. Schmid
- et al.
- 1986
- JVSTA
Calorimetry in thin film processing
- S. Shivashankar
- B. Robinson
- 1986
- JVSTA
Time and angle resolved ultraviolet photoemission spectroscopy studies of single crystal surface and interfaces
- J. Bokor
- R.R. Freeman
- et al.
- 1986
- JVSTA
Propagation of explosive crystallization in thin Rh-Si multilayer films
- J. Floro
- 1986
- JVSTA
Summary Abstract: Classical trajectory calculations of photon-stimulated desorption of ions from alkali-halides
- R.E. Walkup
- Ph. Avouris
- 1986
- JVSTA
Summary Abstract: Non-bulk-like physical properties of thin films due to ion bombardment during film growth
- Eric Kay
- 1986
- JVSTA
X-ray photoelectron spectroscopy of polyacrylonitrile
- C.R. Wu
- W.R. Salaneck
- et al.
- 1986
- Synthetic Metals
Properties of Cr-N films produced by reactive sputtering
- K.K. Shih
- D.B. Dove
- et al.
- 1986
- JVSTA
Summary Abstract: Vibrations of ammonia on the Cu(100) surface
- Ingo Hussla
- Charles W. Bauschlicher
- 1986
- JVSTA