Comparison of electromigration in Cu interconnects with atomic-layer- or physical-vapor-deposited TaN liners
- C.-K. Hu
- L. Gignac
- et al.
- 2007
- JES
Paper
Publications
14462 results for Physical Sciences
Macroscopic quantum tunneling and quasiparticle-tunneling blockade effect in s -wave/d -wave hybrid junctions
- S. Kawabata
- A.A. Golubov
- et al.
- 2007
- Physical Review B - CMMP
PaperBlack's law revisited-Nucleation and growth in electromigration failure
- J.R. Lloyd
- 2007
- Microelectronics Reliability
PaperPlasma-generated craters and spherules
- C.J. Ransom
- Wallace Thornhill
- 2007
- IEEE Transactions on Plasma Science
PaperEstimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
PaperPseudogap in cuprate superconductors: Exploring scaling and quantum critical end point
- L. Krusin-Elbaum
- T. Shibauchi
- 2007
- New3SC 2007
Conference paperUpper limit on spontaneous supercurrents in Sr2 Ru O4
- J.R. Kirtley
- C. Kallin
- et al.
- 2007
- Physical Review B - CMMP
PaperRole of oxygen vacancies in cr-doped SrTiO3 for resistance-change memory
- Markus Janousch
- G. Ingmar Meijer
- et al.
- 2007
- Advanced Materials
PaperElectroluminescence in SrTiO3:Cr single-crystal nonvolatile memory cells
- S.F. Alvarado
- F. La Mattina
- et al.
- 2007
- Applied Physics A: Materials Science and Processing
PaperExperimental investigation of the metastable magnetic properties of Cr-doped InN
- A. Ney
- R. Rajaram
- et al.
- 2007
- Physical Review B - CMMP
Paper