Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction
- M. Pomerantz
- A. Segmüller
- et al.
- 1985
- Thin Solid Films
Paper
Publications
3555 results for Materials Discovery
Summary Abstract: Investigation of the interface chemistry of titanium-tungsten Schottky barrier contacts to silicon by Auger spectroscopy
- J.E. Lewis
- M.O. Aboelfotoh
- et al.
- 1985
- JVSTA
PaperThe adsorption and reaction of ethylene on clean and oxygen covered Pd(100)
- E.M. Stuve
- R.J. Madix
- et al.
- 1985
- Surface Science
PaperProperties and Microelectronic Applications of Thin Films of Refractory Metal Nitrides
- Marc Wittmer
- 1985
- JVSTA
PaperSummary Abstract: Raman scattering at buried semiconductor-metal interfaces
- J.C. Tsang
- 1985
- JVSTA
PaperCharacterization of electron-beam deposited tungsten films on sapphire and silicon
- J.H. Souk
- J.F. O'Hanlon
- et al.
- 1985
- JVSTA
PaperSummary Abstract: Thin films for magnetic recording technology: A review
- J.K. Howard
- 1985
- JVSTA
PaperSummary Abstract: Comparison between the adsorption of PH3 and B2H6 on Si surfaces as related to the CVD of Si
- M.L. Yu
- D.J. Vitkavage
- et al.
- 1985
- JVSTA
PaperInverse photoemission from an unoccupied surface state band on Ag(110)
- B. Reihl
- R.R. Schlittler
- et al.
- 1985
- Surface Science
PaperUnoccupied surface state and conduction band critical points of GaP(110): A high resolution inverse photoemission study
- D. Straub
- M. Skibowski
- et al.
- 1985
- JVSTA
Paper