Optical interconnects for board level applications
- R. Dangel
- R. Beyeler
- et al.
- 2009
- SPIE OPTO 2009
Conference paper
Publications
9289 results for Computer Science
Understanding the quality of monitoring for network management
- Dinesh Verma
- Bong Jun Ko
- et al.
- 2009
- Computer Journal
PaperExposure tool settings and OPC strategies for EUV Lithography at the 16nm node
- Yunfei Deng
- Jongwook Kye
- et al.
- 2009
- SPIE Advanced Lithography 2009
Conference paperFlare evaluation of ASML alpha demo tool
- Hiroyuki Mizuno
- Gregory McIntyre
- et al.
- 2009
- SPIE Advanced Lithography 2009
Conference paperCharacterization of vinyl ether UV-cure nanoimprint resist
- Taiichi Furukawa
- Frances A. Houle
- et al.
- 2009
- SPIE Advanced Lithography 2009
Conference paperModeling and experiments of non-telecentric thick mask effects for EUV lithography
- Gregory McIntyre
- Chiew-Seng Koay
- et al.
- 2009
- SPIE Advanced Lithography 2009
Conference paperCloud analytics: Do we really need to reinvent the storage stack?
- Rajagopal Ananthanarayanan
- Karan Gupta
- et al.
- 2009
- HotCloud 2009
Conference paperCommunication technologies for exascale systems
- J.A. Kash
- P. Pepeljugoski
- et al.
- 2009
- SPIE OPTO 2009
Conference paperTowards optimizing hadoop provisioning in the cloud
- Karthik Kambatla
- Abhinav Pathak
- et al.
- 2009
- HotCloud 2009
Conference paperParameter-specific electronic measurement and analysis of sources of variation using ring oscillators
- Lynn T.-N. Wang
- Liang-Teck Panga
- et al.
- 2009
- SPIE Advanced Lithography 2009
Conference paper