Effects of Impurity Compensation on Injection Current in Si Bipolar Transistors
- D.D. Tang
- Alwin E. Michel
- 1980
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Application of Line-Edge Profile Simulation to Thin-Film Deposition Processes
- Andrew R. Neureuther
- Chiu H. Ting
- et al.
- 1980
- IEEE T-ED
PaperSimulation of Impurity Freezeout Through Numerical Solution of Poisson's Equation with Application to MOS Device Behavior
- Richard C. Jaeger
- Fritz H. Gaensslen
- 1980
- IEEE T-ED
PaperA Study of the Conversion Efficiency Limit of p+-i-n+ Silicon Solar Cells in Concentrated Sunlight
- Terry I. Chappell
- 1980
- IEEE T-ED
PaperHeavy Doping Effects in p-n-p Bipolar Transistors
- D.D. Tang
- 1980
- IEEE T-ED
PaperA Device Model for Buried-Channel CCD's and MOSFET's with Gaussian Impurity Profiles
- Pallab K. Chatterjee
- Geoffrey W. Taylor
- et al.
- 1980
- IEEE T-ED
PaperMemory-Cell Design in Josephson Technology
- Hans H. Zappe
- 1980
- IEEE T-ED
PaperPartially Coherent Imaging in Two Dimensions and the Theoretical Limits of Projection Printing in Microfabrication
- Burn Jeng Lin
- 1980
- IEEE T-ED
PaperSpatial Distribution of Wall Charge Density in AC Plasma Display Panels
- Omesh Sahni
- W.P. Jones
- 1979
- IEEE T-ED
PaperWA-A4 Characteristics of the Currents in p-n-p Bipolar Transistors with Degenerate Base Region
- D.D. Tang
- 1979
- IEEE T-ED
Paper