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Publications
14465 results for Physical Sciences
Charge trapping and detrapping in HfO2 high-κ MOS capacitors using internal photoemission
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- E. Gusev
- et al.
- 2005
- INFOS 2005
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- 2005
- INFOS 2005
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- 2005
- Journal of Physical Chemistry B
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- 2005
- Langmuir
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PaperA recursive un-termination method for nondestructive in situ S-parameter measurement of hermetically encapsulated packages
- Ullrich R. Pfeiffer
- Christian Schuster
- 2005
- IEEE T-MTT
PaperSpatially transient stress effects in thin films by X-ray diffraction
- C.E. Murray
- C.C. Goldsmith
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- 2005
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- Int. J. Solids Struct.
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