On deembedding of port discontinuities in full-wave CAD models of multiport circuits
- Vladimir I. Okhmatovski
- Jason Morsey
- et al.
- 2003
- IEEE T-MTT
Paper
Publications
14462 results for Physical Sciences
Growth of single unit-cell superconducting La2-xSr xCuO4 films
- A. Rüfenacht
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- 2003
- Solid-State Electronics
PaperHow fast can cracks move? A research adventure in materials failure using millions of atoms and big computers
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- 2003
- Advances in Physics
PaperFabrication and Mobility Characteristics of Ultra-thin Strained Si Directly on Insulator (SSDOI) MOSFETs
- K. Rim
- K.K. Chan
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- 2003
- IEDM 2003
Conference paperIssues in NiSi-gated FDSOI device integration
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- Diane Boyd
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- 2003
- IEDM 2003
Conference paperCrystallinity and wet etch behavior of HfO2 films grown by MOCVD
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- Cyril Cabral Jr.
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- 2003
- MRS Proceedings 2003
Conference paperSimulation of quantum electronic transport in small devices: A Master equation approach
- M.V. Fischetti
- S.E. Laux
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- 2003
- IEDM 2003
Conference paperCritical Assessment of Soft Breakdown Stability Time and the Implementation of New Post-Breakdown Methodology for ultra-thin gate oxides
- E. Wu
- J. Suñé
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- 2003
- IEDM 2003
Conference paperCurrent Developments of a High Performance CA Resist for Mask Making Application
- Wu-Song Huang
- Wei He
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- 2003
- Photomask and Next-Generation Lithography Mask Technology 2003
Conference paper20 nm N + abrupt junction formation in Strained Si/Si 1-xGe x MOS device
- K.L. Lee
- F. Cardone
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- 2003
- IEDM 2003
Conference paper