Electrode Flatness Requirements for Cathode Projection Microfabrication Systems
- George A. Wardly
- 1975
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Reduction of Photoresist Standing-Wave Effects by Post-Exposure Bake
- Edward John Walker
- 1975
- IEEE T-ED
PaperIn-Situ Measurement of Dielectric Thickness During Etching or Developing Processes
- Karl L. Konnerth
- Frederick H. Dill
- 1975
- IEEE T-ED
PaperModeling Projection Printing of Positive Photoresists
- James A. Tuttle
- Ed ward John Walker
- 1975
- IEEE T-ED
PaperOptical Lithography
- Frederick H. Dill
- 1975
- IEEE T-ED
PaperV–1 Laser Fabrication of Large-Area Arrays: Thin-Film Silicon Isolated Devices on Fused Silica Substrates
- R.A. Laff
- G.L. Hutchins
- 1974
- IEEE T-ED
PaperScanning Limitations of Liquid-Crystal Displays
- Paul M. Alt
- Peter Pleshko
- 1974
- IEEE T-ED
PaperBistable Switching and Conduction Mechanisms in Nb-Nb2O5-Bi Junctions
- S. Basavaiah
- K.C. Park
- 1973
- IEEE T-ED
PaperA New form of Gas Discharge Display
- W.B. Pennebaker
- 1973
- IEEE T-ED
PaperMachining Integrated Optical Structures in Photoresist
- F.H. Dill
- A.R. Neureuther
- 1973
- IEEE T-ED
Paper