Buckling characterization of gate all around silicon nanowires
- Shimon Levi
- Ishai Schwarzband
- et al.
- 2013
- SPIE Advanced Lithography 2013
Conference paper
Publications
26878 results for Science
Distant supervision for relation extraction with an incomplete knowledge base
- Bonan Min
- Ralph Grishman
- et al.
- 2013
- NAACL-HLT 2013
Conference paperDiscriminative training of 150 million translation parameters and its application to pruning
- Hendra Setiawan
- Bowen Zhou
- 2013
- NAACL-HLT 2013
Conference paperImproving reordering performance using higher order and structural features
- Mitesh M. Khapra
- Ananthakrishnan Ramanathan
- et al.
- 2013
- NAACL-HLT 2013
Conference paperFinding what matters in questions
- Xiaoqiang Luo
- Hema Raghavan
- et al.
- 2013
- NAACL-HLT 2013
Conference paperMore than meets the eye: Study of human cognition in sense annotation
- Salil Joshi
- Diptesh Kanojia
- et al.
- 2013
- NAACL-HLT 2013
Conference paperTowards Reliability-Aware Entity Analytics and Integration for Noisy Text at Scale
- Sameep Mehta
- L. Venkata Subramaniam
- 2013
- NAACL-HLT 2013
TutorialIXora: Exact haplotype inferencing and trait association
- Filippo Utro
- Niina Haiminen
- et al.
- 2013
- BMC Genetics
PaperPattern transfer of directed self-assembly (DSA) patterns for CMOS device applications
- Hsin-Yu Tsai
- Hiroyuki Miyazoe
- et al.
- 2013
- SPIE Advanced Lithography 2013
Conference paperEtch correction and OPC, a look at the current state and future of etch correction
- Ian Stobert
- Derren Dunn
- 2013
- SPIE Advanced Lithography 2013
Conference paper