Characterization of nitrogen-containing glasses by x-ray photoelectron spectroscopy
- G.H. Frischat
- R. Fern
- 1986
- JVSTA
Paper
Publications
176 results at JVSTA
Effect of the sintering process on the formation and passivation of PtSi
- H.-C.W. Huang
- F.E. Turene
- et al.
- 1986
- JVSTA
PaperSynchrotron-radiation excited carbon is photoemission study of Cr/organic polymer interfaces
- J.L. Jordan
- P.N. Sanda
- et al.
- 1986
- JVSTA
PaperSummary Abstract: High temperature decomposition of SiO2at the Si/SiO2 interface
- G.W. Rubloff
- R.M. Tromp
- et al.
- 1986
- JVSTA
PaperLow temperature material reaction at the Ti/Si(111) interface
- R.M. Tromp
- G.W. Rubloff
- et al.
- 1986
- JVSTA
PaperMetal-derived band gap states: Ti on GaAs(110)
- R. Ludeke
- D. Straub
- et al.
- 1986
- JVSTA
PaperAnomalous structures in thin in-ge films
- A. Kapitulnik
- 1986
- JVSTA
PaperEffects of deposition methods on the temperature-dependent resistivity of tunasten films
- L. Krusin-Elbaum
- K.Y. Ahn
- et al.
- 1986
- JVSTA
PaperSummary Abstract: Reactive ion-etching-related Si surface residues and subsurface disorder
- G.S. Oehrlein
- J.G. Clabes
- et al.
- 1986
- JVSTA
PaperHollow-cathode-enhanced magnetron sputtering
- J.J. Cuomo
- S.M. Rossnagel
- 1986
- JVSTA
Paper