Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies
- J.C. Tsang
- M.V. Fischetti
- 2001
- Microelectronics Reliability
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Publications
14466 results for Physical Sciences
Development of Aluminum Chemical Mechanical Planarization
- Maria Ronay
- 2001
- JES
PaperPerpendicular magnetic anisotropy in ultrathin yttrium iron garnet films prepared by pulsed laser deposition technique
- E. Popova
- N. Keller
- et al.
- 2001
- Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
PaperPhase boundary fluctuations on Si(111)
- J.B. Hannon
- R.M. Tromp
- 2001
- Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
PaperContinuum and atomistic studies of intersonic crack propagation
- Huajian Gao
- Yonggang Huang
- et al.
- 2001
- Journal of the Mechanics and Physics of Solids
PaperStannous(II) trifluoromethane sulfonate: A versatile catalyst for the controlled ring-opening polymerization of lactides: Formation of stereoregular surfaces from polylactide "brushes"
- Michael Mller
- Fredric Nederberg
- et al.
- 2001
- J Polym Sci Part A
PaperCarbon Nanotube Inter- and Intramolecular Logic Gates
- V. Derycke
- R. Martel
- et al.
- 2001
- Nano Letters
PaperHigh resolution patterning in chemically amplified resists: The effect of film thickness
- David R. Medeiros
- Wayne M. Moreau
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperIBM 193nm bilayer resist: Materials, lithographic performance and optimization
- Ranee Kwong
- P. Rao Varanasi
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
PaperSilicon-containing resists for 157 nm applications
- Ratnam Sooriyakumaran
- Debra Fenzel-Alexander
- et al.
- 2001
- Proceedings of SPIE - The International Society for Optical Engineering
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