Layout Optimization at the pinnacle of Optical Lithography
- Lars Liebmann
- Greg Northrop
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Conference paper
Publications
9290 results for Computer Science
Applications of image diagnostics to metrology quality assurance and process control
- John A. Allgair
- Victor V. Boksha
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Conference paperFailure prediction across process window for robust OPC
- Shumay D. Shang
- Yuri Granik
- et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Conference paperVisual Problem-Solving Support for New Event Triage in Centralized Network Security Monitoring: Challenges, Tools and Benefits
- Markus Stolze
- René Pawlitzek
- et al.
- 2003
- IT-Incident Management & IT-Forensics 2003
Conference paperVisualization, Optimization, and Business Strategy: A Case Study
- Donna L. Gresh
- Eugene I. Kelton
- 2003
- VIS 2003
Conference paperColor Image Semantics for Digital Libraries
- Aleksandra Mojsilovic
- Bernice E. Rogowitz
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperDigital Image Acquisition and Continuous Zoom Display from Multiple-Resolution Views Using Heterogeneous Image Pyramids
- Belle L. Tseng
- 2003
- VDA 2003
Conference paperApplication of blurring filters to improve detection of invisible image watermarks
- Gordon W. Braudaway
- Fred Mintzer
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperPerceptual Color and Spatial Texture Features for Segmentation
- Junqing Chen
- Thrasyvoulos N. Pappas
- et al.
- 2003
- IS&T/SPIE Electronic Imaging 2003
Conference paperWatching chips work: Optical imaging of hot carriers in ICs
- J.C. Tsang
- 2002
- ECS Meeting 2002
Conference paper