An anomalous correlation between gate leakage current and threshold voltage fluctuation in advanced MOSFETs
- Zihong Liu
- Paul Chang
- et al.
- 2010
- IEDM 2010
Conference paper
Publications
24902 results for Exploratory Science
Co capping layers for Cu/low-k interconnects
- C.-C. Yang
- P. Flaitz
- et al.
- 2010
- ADMETA 2010
Conference paperAdding stream processing system flexibility to exploit low-overhead communication systems
- Philippe Selo
- Yoonho Park
- et al.
- 2010
- WHPCF 2010
Conference paperA 0.039um2 high performance eDRAM cell based on 32nm high-K/metal SOI technology
- Nauman Z. Butt
- Kevin McStay
- et al.
- 2010
- IEDM 2010
Conference paperEmpirical methods for two-echelon inventory management with service level constraints based on simulation-regression
- Lin Li
- Karthik Sourirajan
- et al.
- 2010
- WSC 2010
Conference paperDevice, circuit and system-level analysis of noise in multi-bit phase-change memory
- Gael F. Close
- Urs Frey
- et al.
- 2010
- IEDM 2010
Conference paperCopper microstructure: Effect on electromigration void evolution
- C. Witt
- V. Calero
- et al.
- 2010
- ADMETA 2010
Conference paperPerformance of multi-process and multi-thread processing on multi-core SMT processors
- Hiroshi Inoue
- Toshio Nakatani
- 2010
- IISWC 2010
Conference paperContext slices: Representing contexts in OWL
- Chris Welty
- 2010
- ISWC 2010
Workshop paperExtending a model-driven engineering environment to support product line engineering
- Dolev Dotan
- Tomer Amarilio
- et al.
- 2010
- ECMFA 2010
Workshop paper