Resonant inelastic soft X-ray scattering as a bandstructure probe: A primer
- S. Eisebitt
- J. Lüning
- et al.
- 1999
- physica status solidi (b)
Paper
Publications
14466 results for Physical Sciences
CMOS scaling beyond 0.1 μm: how far can it go?
- Y. Taur
- 1999
- International Symposium on VLSI Technology, Systems, and Applications, Proceedings
PaperPractical resolution limit of KrF lithography
- Ralf Schuster
- 1999
- International Symposium on VLSI Technology, Systems, and Applications, Proceedings
PaperSurface potential studies of self-assembling monolayers using Kelvin probe force microscopy
- J. Lü
- L. Eng
- et al.
- 1999
- Surface and Interface Analysis
PaperPREVAIL: Operation of the electron optics proof-of-concept system
- M. Gordon
- J.E. Lieberman
- et al.
- 1999
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperEffects of helicity on Lagrangian and Eulerian time correlations in turbulence
- Robert Rubinstein
- Ye Zhou
- 1999
- Physics of Fluids
PaperInterdiffusion studies of single crystal TiN/NbN superlattice thin films
- C. Engström
- J. Birch
- et al.
- 1999
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperApplication of 4-methyl-1-acetoxycalix[6]arene resist to complementary metal-oxide-semiconductor gate processing
- Michael J. Rooks
- Ari Aviram
- 1999
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperCharacteristics of chemical vapor deposition diamond films for x-ray mask substrates
- Cameron J. Brooks
- Lynn A. Powers
- et al.
- 1999
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
PaperObservation of field-periodic magneto-conductance oscillations in a GaAs/Ga0.77Al0.23As heterojunction
- E.J. Pakulis
- 1999
- Semiconductor Science and Technology
Paper