In situ X-ray diffraction study of thin film Ir/Si solid state reactions
- W. Knaepen
- J. Demeulemeester
- et al.
- 2010
- Microelectronic Engineering
Paper
Publications
24861 results for Exploratory Science
Subagging for credit scoring models
- Giuseppe Paleologo
- André Elisseeff
- et al.
- 2010
- EJOR
PaperIdentifying trouble patterns in complex IT services engagements
- Krishna Ratakonda
- Rose Williams
- et al.
- 2010
- IBM J. Res. Dev
PaperMacroSS: Macro-SIMDization of streaming applications
- Amir H. Hormati
- Yoonseo Choi
- et al.
- 2010
- ACM SIGPLAN Notices
PaperTwo-step MIR inequalities for mixed integer programs
- Sanjeeb Dash
- Marcos Goycoolea
- et al.
- 2010
- INFORMS Journal on Computing
PaperIn situ study of the formation of silicide phases in amorphous Co-Si mixed layers
- C. Van Bockstael
- K. De Keyser
- et al.
- 2010
- Microelectronic Engineering
PaperOn the complexity of cutting-plane proofs using split cuts
- 2010
- Operations Research Letters
PaperComputing arbitrary functions of encrypted data
- Craig Gentry
- 2010
- CACM
PaperIII-V/Silicon-on-lnsulator nanophotonic cavities for optical network-on-chip
- Liu Liu
- Günther Roelkens
- et al.
- 2010
- Journal of Nanoscience and Nanotechnology
ReviewO(√log n) approximation to sparsest cut in õ(n2) time
- Sanjeev Arora
- Elad Hazan
- et al.
- 2010
- SIAM Journal on Computing
Paper