Impact of substrate bias on GIDL for thin-BOX ETSOI devices
- Pranita Kulkarni
- Q. Liu
- et al.
- 2011
- SISPAD 2011
Conference paper
Publications
26923 results for Science
Critical analysis of 14nm device options
- Phil Oldiges
- R. Muralidhar
- et al.
- 2011
- SISPAD 2011
Conference paperAnalysis of Si, InAs, and Si-InAs tunnel diodes and tunnel FETs using different transport models
- Andreas Schenk
- Reto Rhyner
- et al.
- 2011
- SISPAD 2011
Conference paperSimulation of channel electron mobility due to scattering with interfacial phonon-plasmon modes in silicon nanowire under the presence of high-k oxide and metal gate
- Kai Xiu
- 2011
- SISPAD 2011
Conference paperExploring MOL design options for a 20nm CMOS technology using TCAD
- Andreas Scholze
- Stephen Furkay
- et al.
- 2011
- SISPAD 2011
Conference paperTesting tasks management in testing Cloud environment
- Lian Yu
- Xiaohu Li
- et al.
- 2011
- COMPSAC 2011
Conference paperSurface dynamics of amorphous polymers used for high-voltage insulators
- Philip T. Shemella
- Teodoro Laino
- et al.
- 2011
- Journal of Physical Chemistry B
PaperGeoSpatial-temporal analytics to gain insight from linked open data
- Margarete Donovang-Kuhlisch
- Mike Small
- 2011
- ICE 2011
Conference paperDeclarative business artifact centric modeling of decision and knowledge intensive business processes
- Roman Vaculín
- Richard Hull
- et al.
- 2011
- EDOC 2011
Conference paperTowards flexible service interoperation using business artifacts
- Richard Hull
- 2011
- EDOC 2011
Conference paper