Noble metal suicide formation in metal/Si structures during oxygen annealing: Implications for perovskite-based memory devices
- K.L. Saenger
- A. Grill
- et al.
- 1998
- Journal of Materials Research
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Publications
14466 results for Physical Sciences
Characterization of the hot-electron-induced degradation in thin SiO2 gate oxides
- E. Cartier
- 1998
- Microelectronics Reliability
PaperNondestructive evaluation of interfaces in bonded silicon-on-insulator structures using the picosecond ultrasonics technique
- H.-Y. Hao
- H.J. Maris
- et al.
- 1998
- Electrochemical and Solid-State Letters
PaperPeierls-Holstein dimer model with coherent, squeezed oscillatory trial functions
- H. Morawitz
- P. Reineker
- et al.
- 1998
- Journal of Luminescence
PaperHigh concentration Bi δ-doping layers on Si(001)
- J. Falta
- O. Mielmann
- et al.
- 1998
- Applied Surface Science
PaperEvolution and progress of deep uv resist materials
- Hiroshi Ito
- 1998
- J. Photopolym. Sci. Tech.
PaperEpitaxial free energy and stability under epitaxial strain
- P.M. Marcus
- 1998
- Surface Review and Letters
PaperDirect observation of the behavior of single macromolecules at the gas-liquid interface
- Junhua Wu
- Gerhard Wegner
- 1998
- Thin Solid Films
PaperEnd Group Effects on Adhesion of Perfluoropolyether Lubricants to Solid Substrates
- Cheng-Bai Xu
- Curtis W. Frank
- et al.
- 1998
- Journal of Adhesion
PaperFabrication of photoplastic high-aspect ratio microparts and micromolds usina SU-8 UV resist
- H. Lorenz
- M. Despont
- et al.
- 1998
- Microsystem Technologies
Paper