Absence of localization in certain field-effect transistors
- S. Washburn
- K.P. Li
- et al.
- 1998
- Superlattices and Microstructures
Paper
Publications
14466 results for Physical Sciences
Elastic anisotropy of β-silicon nitride whiskers
- Jack C. Hay
- Ellen Y. Sun
- et al.
- 1998
- JACerS
PaperElectron localization effects on the low-temperature high-field magnetoresistivity of three-dimensional amorphous superconductors
- A. Samoilov
- N.C. Yeh
- et al.
- 1998
- Physical Review B - CMMP
PaperThe thermal stability of CoSi2 on polycrystalline silicon: The effect of silicon grain size and metal thickness
- J.P. Gambino
- E.G. Colgan
- et al.
- 1998
- JES
PaperBiquadratic coupling dependence on spacer layer thickness for Fe/Cr/Fe
- A. Azevedo
- C. Chesman
- et al.
- 1998
- Journal of Magnetism and Magnetic Materials
PaperInterface state capture cross section measurements on vacuum annealed and radiation damaged Si:SiO2 surfaces
- M.J. Uren
- V. Nayar
- et al.
- 1998
- JES
PaperFEOL technology trend
- Yuan Taur
- Tak H. Ning
- 1998
- Materials Chemistry and Physics
ReviewDirectional and ionized physical vapor deposition for microelectronics applications
- S.M. Rossnagel
- 1998
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
ReviewComparison of secondary ion mass spectrometry profiling of sub-100 nm ultrashallow junctions using NO+2 and O+2 sputtering
- P.A. Ronsheim
- K.L. Lee
- 1998
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
ReviewMacromolecular engineering via 'living' free radical polymerizations
- Eva E. Malmström
- Craig J. Hawker
- 1998
- Macromolecular Chemistry and Physics
Review