S-STIR: Similarity search through iterative refinement
- Chung-Sheng Li
- John R. Smith
- et al.
- 1998
- IS&T/SPIE Electronic Imaging 1998
Conference paper
Publications
9271 results for Computer Science
Reactive ion etching of 193-nm resist candidates: Current platforms and future requirements
- Thomas I. Wallow
- Phillip J. Brock
- et al.
- 1998
- Microlithography 1998
Conference paper"Copper chip" technology
- D. Edelstein
- 1998
- Microelectronic Manufacturing 1998
Conference paperTwisted nematic modes for liquid-crystal-on-silicon projectors
- K.H. Yang
- Minhua Lu
- 1998
- SPIE Photonics West 1998
Conference paperAutomatic visible watermarking of images
- A. Ravishankar Rao
- Gordon W. Braudaway
- et al.
- 1998
- SPIE Photonics West 1998
Conference paperEffects of underlayer on performance of bilayer resists for 248-nm lithography
- Katherina Babich
- Alessandro Callegari
- et al.
- 1998
- Microlithography 1998
Conference paperThe match score image: A visualization tool for image query refinement
- Lawrence D. Bergman
- Vittorio Castelli
- 1998
- SPIE Photonics West 1998
Conference paperDUV stability of carbon films for attenuated phase shift mask applications
- Alessandro Callegari
- Katherina Babich
- et al.
- 1998
- SPIE Advanced Lithography 1998
Conference paperMultimedia content customization for universal access
- Rakesh Mohan
- John R. Smith
- et al.
- 1998
- Photonics East 1998
Conference paperMemory characterization of a parallel data mining workload
- Jin-Soo Kim
- Xiaohan Qin
- et al.
- 1998
- WWC 1998
Conference paper