3D-AFM enhancement for CD metrology dedicated to lithography sub-28-nm node requirements
- Johann Foucher
- Narender Rana
- et al.
- 2010
- SPIE Advanced Lithography 2010
Conference paper
Publications
26924 results for Science
Quantifying the value of rfid in air cargo handling process: A simulation approach
- Miao He
- Jacqueline Morris
- et al.
- 2010
- WSC 2010
Conference paperA 0.039um2 high performance eDRAM cell based on 32nm high-K/metal SOI technology
- Nauman Z. Butt
- Kevin McStay
- et al.
- 2010
- IEDM 2010
Conference paperWe are all lurkers: Consuming behaviors among authors and readers in an enterprise file-sharing service
- Michael Muller
- N. Sadat Shami
- et al.
- 2010
- GROUP 2010
Conference paperTransforming value perception in music information systems
- Belinda Fridey
- Jacob Cybulski
- et al.
- 2010
- AMCIS 2010
Conference paperSwitching distributions and write reliability of perpendicular spin torque MRAM
- D.C. Worledge
- G. Hu
- et al.
- 2010
- IEDM 2010
Conference paperStabilizer subsystem codes with spatially local generators
- Sergey Bravyi
- 2010
- ITW 2010
Conference paperCOD: An adaptive utility learning method for composite recommendations
- Khalid Alodhaibi
- Alexander Brodsky
- et al.
- 2010
- AIMaS 2010
Conference paperEnhancing mention detection using projection via aligned corpora
- Yassine Benajiba
- Imed Zitouni
- 2010
- EMNLP 2010
Conference paperMobile phones for health education in the developing world: SMS as a user interface
- Catalina M. Danis
- Jason B. Ellis
- et al.
- 2010
- ACM DEV 2010
Conference paper