Publications

14466 results for Physical Sciences

Impact of the electrochemical properties of silicon wafer surfaces on copper outplating from HF solutions
- - I. Teerlinck
  - P.W. Mertens
  - et al.
- 1996
- JES
Paper
Adhesion of poly(arylene ether benzimidazole) to copper and polyimides
- - K.-W. Lee
  - A. Viehbeck
  - et al.
- 1996
- Journal of Adhesion Science and Technology
Paper
On boundary conditions in lattice Boltzmann methods
- - Shiyi Chen
  - Daniel Martínez
  - et al.
- 1996
- Physics of Fluids
Paper
Precisions on reaction monitoring from in-situ resistance measurements: Relations between such measurements and actual reaction kinetics
- - S.-L. Zhang
  - F.M. D'Heurle
- 1996
- Thin Solid Films
Paper
Stress-induced roughening in epitaxial growth
- - J. Tersoff
- 1996
- Applied Surface Science
Paper
High resolution electron beam lithography using ZEP-520 and KRS resists at low voltage
- - D.M. Tanenbaum
  - C.W. Lo
  - et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
A study of X-ray reflectivity data analysis methods for thin film thickness determination
- - D.T. Brower
  - R.E. Revay
  - et al.
- 1996
- Powder Diffraction
Paper
An inquiry concerning the principles of Si 2p core-level photoemission shift assignments at the Si/SiO₂ interface
- - F.R. McFeely
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Polymer chain organization and orientation in ultrathin films: A spectroscopic investigation
- - M.M. Despotopoulou
  - R.D. Miller
  - et al.
- 1996
- Journal of Polymer Science, Part B: Polymer Physics
Paper
Correlation of UVIIHS resist chemistry to dissolution rate measurements
- - J. Thackeray
  - T.H. Fedynyshyn
  - et al.
- 1996
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper