Electromigration in two-level interconnects of Cu and Al alloys
- C.-K. Hu
- B. Luther
- 1995
- Materials Chemistry & Physics
Review
Publications
14462 results for Physical Sciences
Electrical transport properties of hot electrons at metal, insulator, and semiconductor interfaces
- R. Ludeke
- A. Bauer
- 1995
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperReaction field, screening, and long-range interactions in simulations of ionic and dipolar systems
- J.A. Barker
- 1994
- Molecular Physics
PaperInformation depth in EELS of an organic solid
- R.J. Purtell
- M. Pomerantz
- et al.
- 1994
- Surface Science
PaperThermal stability of silicide on polycrystalline Si
- Q.Z. Hong
- Stella Q. Hong
- et al.
- 1994
- Thin Solid Films
PaperProjector augmented-wave method
- P.E. Blöchl
- 1994
- Physical Review B
PaperTunneling between edge states in clean multiple GaAs/AlxGa1-xAs rings and increase of the phase coherence length with magnetic field
- J. Liu
- W.X. Gao
- et al.
- 1994
- Physical Review B
PaperMonte Carlo investigation of head-tail ordering of CO monolayers on graphite
- D. Marx
- S. Sengupta
- et al.
- 1994
- Surface Science
PaperSi ALE using chlorine/hydrogen exchange. Fundamentals and films
- D.D. Koleske
- S. Gates
- 1994
- Applied Surface Science
PaperPlanar RF induction plasma coupling efficiency
- J. Hopwood
- 1994
- Plasma Sources Science and Technology
Paper