In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon
- W. Knaepen
- C. Detavernier
- et al.
- 2008
- Thin Solid Films
Paper
Publications
3553 results for Materials Discovery
Fabrication of 20 nm half-pitch gratings by corrugation-directed self-assembly
- Ho-Cheol Kim
- Charles T. Rettner
- et al.
- 2008
- Nanotechnology
PaperRole of chamber dimension in fluorocarbon based deposition and etching of Si O2 and its effects on gas and surface-phase chemistry
- E. Joseph
- B.-S. Zhou
- et al.
- 2008
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperDevelopment of a simple mixed-mode fracture test and the resulting fracture energy envelope for an adhesive bond
- Soojae Park
- David A. Dillard
- 2008
- International Journal of Fracture
PaperTunneling phenomena in carbon nanotube field-effect transistors
- Joachim Knoch
- Joerg Appenzeller
- 2008
- Physica Status Solidi (A) Applications and Materials Science
PaperPlasma ash processing solutions for advanced interconnect technology
- N. Fuller
- M.A. Worsley
- et al.
- 2008
- Thin Solid Films
PaperUndercooling and microhardness of Pb-free solders on various under bump metallurgies
- Moon Gi Cho
- Sung K. Kang
- et al.
- 2008
- Journal of Materials Research
PaperChemical and structural modifications in a 193-nm photoresist after low-k dry etch
- E. Kesters
- M. Claes
- et al.
- 2008
- Thin Solid Films
PaperEffect of elevated implant temperature on amorphization and activation in as-implanted silicon-on-insulator layers
- Katherine L. Saenger
- Stephen W. Bedell
- et al.
- 2008
- MRS Spring Meeting 2008
Conference paperThickness-dependent crystallization behavior of phase change materials
- Simone Raoux
- Jean L. Jordan-Sweet
- et al.
- 2008
- MRS Spring Meeting 2008
Conference paper