Tunnel Current Controlled Atomic Force Microscope Designs
- P.J. Bryant
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paper
Publications
14462 results for Physical Sciences
Growth and Morphology of Partial and Multilayer Fe Thin Films on Cu(100) and the Effect of Adsorbed Gases Studied by Scanning Tunneling Microscopy
- K. Johnson
- D.D. Chambliss
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperForce Microscopy with Actively Stabilized Differential Fiber Detection Mechanism
- H.K. Wickramasinahe
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperRole of Stress Relief in the Hexagonai=Close=Packed to Face-Centered-Cubic Phase Transformation in Cobalt Thin Films
- D.A. Smith
- K. Barmak
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperControl of as Diffusion using Ultrathin Metal Passivating Layers at GaAs(100) Surfaces
- P.D. Kirchner
- G.D. Pettit
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperCarrier Injection and Scanning Tunneling Microscopy at the Si(111)-2x1 Surface
- R.M. Feenstra
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperElectron and Hole Spin Lifetimes in zn1-xMnxSe and Zn1-yFeyse Based Heterostructures
- L.P. Fu
- W.Y. Yu
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperScanning Tunneling Microscope Tip-Sample Interactions: Atomic Modification of Si and Nanometer Si Schottky Diodes
- Ph. Avouris
- I.-W. Lyo
- et al.
- 1993
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperNon-Silver Paste Method for Making Thermal Contact to Substrates for High Tc Film Growth
- R.P. Robertazzf
- B. Oh
- 1993
- IEEE TAS
PaperInvestigation of In-Situ Ag/YBCO Contacts for SNS Devices
- R.P. Robertazzi
- A. W Kleinsasser
- et al.
- 1993
- IEEE TAS
Paper