Electromigration damage in aluminum film conductors
- M.J. Attardo
- R. Rosenberg
- 2003
- Journal of Applied Physics
Paper
Publications
2360 results at Journal of Applied Physics
Pressure dependence of barrier heights in GeSingle Bond signGaAs n - N heterojunctions
- W.E. Howard
- A.B. Fowler
- et al.
- 2003
- Journal of Applied Physics
PaperMagnetic and magneto-optic properties of EuO films doped with trivalent rare-earth oxide
- K.Y. Ahn
- T.R. McGuire
- 2003
- Journal of Applied Physics
PaperA coupled magnetic film device for associative memories
- C.P. Wang
- 2003
- Journal of Applied Physics
PaperPerpendicular anisotropy in electrodeposited nickel films
- A.F. Mayadas
- E. Klokholm
- 2003
- Journal of Applied Physics
PaperConduction bands in In1-xAlxP
- A.A. Onton
- R.J. Chicotka
- 2003
- Journal of Applied Physics
PaperDominant surface electronic properties of SiO2-passivated Ge surfaces as a function of various annealing treatments
- T.O. Sedgwick
- 2003
- Journal of Applied Physics
PaperResistivity anomaly in conducting europium chalcogenides
- S. Von Molnar
- S. Methfessel
- 2003
- Journal of Applied Physics
PaperProperties of GaP green-light-emitting diodes grown by liquid-phase epitaxy
- K.K. Shih
- G.D. Pettit
- 2003
- Journal of Applied Physics
PaperEfficient green electroluminescence from gap p-n junctions grown by liquid-phase epitaxy
- K.K. Shih
- J. Woodall
- et al.
- 2003
- Journal of Applied Physics
Paper