Quantitative time‐of‐flight secondary ion mass spectrometry of a perfluorinated polyether
- David E. Fowler
- Roboert D. Johnson
- et al.
- 2004
- Surface and Interface Analysis
Paper
Publications
3555 results for Materials Discovery
Electric‐field‐induced room‐temperature doping in CuInSe2
- Abram Jakubowicz
- Geula Dagan
- et al.
- 2004
- Advanced Materials
PaperInterfacial reactions between Al and RuO2, MoOx and WNx diffusion barriers on Si
- S.-E. Hörnström
- A. Charai
- et al.
- 2004
- Surface and Interface Analysis
PaperFerroelectric liquid crystalline polysiloxanes with high spontaneous polarization and possible applications in nonlinear optics
- Heinrich Kapitza
- Rudolf Zentel
- et al.
- 2004
- Advanced Materials
PaperInfluence of the bombarding ion energy and surface composition on the ground‐state atom fraction in solids analysis using multiphoton resonance ionization
- David L. Pappas
- David M. Hrubowchak
- et al.
- 2004
- Surface and Interface Analysis
PaperPolysilanes—a new look at some old materials
- Robert D. Miller
- 2004
- Advanced Materials
ReviewOn the role of Gibbsian segregation in causing preferential sputtering
- Roger Kelly
- 2004
- Surface and Interface Analysis
ReviewSurface modification with lasers
- Paul B. Comita
- 2004
- Advanced Materials
ReviewStudies of deformation-induced texture development in sheet materials using diffraction techniques
- S.W. Banovic
- M.D. Vaudin
- et al.
- 2004
- Materials Science and Engineering: A
PaperPrecise control over molecular dimensions of block-copolymer domains using the interfacial energy of chemically nanopatterned substrates
- Erik W. Edwards
- Martha F. Montague
- et al.
- 2004
- Advanced Materials
Paper