Reliability challenges with ultra-low k interlevel dielectrics
- J.R. Lloyd
- M. Lane
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- 2004
- Microelectronics Reliability
Conference paper
Publications
24864 results for Exploratory Science
Time dependent dielectric breakdown in a low-k interlevel dielectric
- J.R. Lloyd
- E. Liniger
- et al.
- 2004
- Microelectronics Reliability
Conference paperCurrent crowding in faulty MOSFET: Optical and electrical investigation
- A. Tosi
- F. Stellari
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- 2004
- Microelectronics Reliability
Conference paperTesting of ultra low voltage VLSI chips using the superconducting single-photon detector (SSPD)
- Franco Stellari
- Peilin Song
- 2004
- Microelectronics Reliability
Conference paperA first-principles analysis of the magnetism of CuII polynuclear coordination complexes: The case of [Cu4(bpy)4(aspartate) 2(H2O)3](ClO4)4 ·2. 5H2O
- Mercè Deumal
- Jordi Ribas-Ariño
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- 2004
- Molecules
PaperStructural anomalies in hcp metals under pressure: Zn and Cd
- S.L. Qiu
- F. Apostol
- et al.
- 2004
- Journal of Physics Condensed Matter
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- J.M.J. Fréchet
- S. Matuszczak
- et al.
- 2004
- Polymer Engineering & Science
PaperLaser interferometry: A measurement technique for diffusion studies in thin polymer films
- K.L. Saenger
- Ho-Ming Tong
- 2004
- Polymer Engineering & Science
PaperThe coupled relaxation model for toner melt rheology
- Tom Karis
- C.Mark Seymour
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- 2004
- Polymer Engineering & Science
PaperPhotothermal methods for the measurement of thermal properties of thin polymer films
- H. Coufal
- 2004
- Polymer Engineering & Science
Paper