Voltage dependence of the MOSFET gate-to-source/drain overlap
- C.S. Oh
- W.H. Chang
- et al.
- 1990
- Solid State Electronics
Paper
Publications
14466 results for Physical Sciences
Properties of W-N and Mo-N films prepared by reactive sputtering
- K.K. Shih
- D.B. Dove
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperEquilibrium surface hydrogen coverage during silicon epitaxy using SiH4
- C.M. Greenlief
- M. Offenberg
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperElectromagnetic radiation from printed traces on a circuit board with coated plastic cover
- Jean-Fu Kiang
- 1990
- IEEE MTT-S International Microwave Symposium Digest
PaperInfluence of superimposed hydrostatic pressure on bending fracture and formability of a low carbon steel containing globublar sulfides
- A.S. Kao
- H.A. Kuhn
- et al.
- 1990
- Journal of Engineering Materials and Technology, Transactions of the ASME
PaperAnisotropic magnetoresistance in Co films
- P. Freitas
- A.A. Gomes
- et al.
- 1990
- Journal of Magnetism and Magnetic Materials
PaperAdhesion enhancement of Cr/polyimide interfaces using RF pre-sputtering of polyimide surfaces
- T.S. Oh
- S.P. Kowalczyk
- et al.
- 1990
- Journal of Adhesion Science and Technology
PaperSpecific heat of La2−xSrxCuO4: Volume fraction of superconductivity; Possible structural transition at 45K
- A. Amato
- R.A. Fisher
- et al.
- 1990
- Physica B: Condensed Matter
PaperEffect of atomic size on the minimum X-ray absorption coefficient in the six-beam Borrmann diffraction
- R.E. Feldman
- T.C. Huang
- 1990
- Solid State Communications
PaperHigh resolution electron energy loss spectroscopic characterization of insulators for Si technology
- M. Liehr
- P.A. Thiry
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
Paper