Toward a business process grid for utility computing
- Liang-Jie Zhang
- Haifei Li
- et al.
- 2004
- IT Professional
Review
Publications
24906 results for Exploratory Science
Reliability challenges with ultra-low k interlevel dielectrics
- J.R. Lloyd
- M. Lane
- et al.
- 2004
- Microelectronics Reliability
Conference paperTime dependent dielectric breakdown in a low-k interlevel dielectric
- J.R. Lloyd
- E. Liniger
- et al.
- 2004
- Microelectronics Reliability
Conference paperIn-situ observations of self-assembled island nucleation on patterned substrates
- F.M. Ross
- M. Kammler
- et al.
- 2004
- Philosophical Magazine
Conference paperCurrent crowding in faulty MOSFET: Optical and electrical investigation
- A. Tosi
- F. Stellari
- et al.
- 2004
- Microelectronics Reliability
Conference paperTesting of ultra low voltage VLSI chips using the superconducting single-photon detector (SSPD)
- Franco Stellari
- Peilin Song
- 2004
- Microelectronics Reliability
Conference paperA first-principles analysis of the magnetism of CuII polynuclear coordination complexes: The case of [Cu4(bpy)4(aspartate) 2(H2O)3](ClO4)4 ·2. 5H2O
- Mercè Deumal
- Jordi Ribas-Ariño
- et al.
- 2004
- Molecules
PaperStructural anomalies in hcp metals under pressure: Zn and Cd
- S.L. Qiu
- F. Apostol
- et al.
- 2004
- Journal of Physics Condensed Matter
PaperChemically amplified resists based on polymer side‐chain rearrangement or electrophilic crosslinking
- J.M.J. Fréchet
- S. Matuszczak
- et al.
- 2004
- Polymer Engineering & Science
PaperLaser interferometry: A measurement technique for diffusion studies in thin polymer films
- K.L. Saenger
- Ho-Ming Tong
- 2004
- Polymer Engineering & Science
Paper