Rie-induced damage and contamination in silicon
- Young H. Lee
- G.S. Oehrlein
- et al.
- 1989
- Radiation Effects and Defects in Solids
Paper
Publications
14467 results for Physical Sciences
Suppressing critical slowing down in two-dimensional Ising model simulations by the multigrid Monte Carlo method
- E. Stoll
- 1989
- Journal of Physics Condensed Matter
PaperSecondary ion mass spectrometry measurements of deuterium penetration into silicon by low pressure rf glow discharges
- Gottlieb S. Oehrlein
- Gerald J. Scilla
- 1989
- Radiation Effects and Defects in Solids
PaperConductance determined by transmission: Probes and quantised constriction resistance
- R. Landauer
- 1989
- Journal of Physics Condensed Matter
PaperSpectroscopy with the scanning tunnelling microscope: A critical review
- R.M. Tromp
- 1989
- Journal of Physics Condensed Matter
ReviewA 27 GHz 20 ps PNP technology
- J. Warnock
- P.F. Lu
- et al.
- 1989
- IEDM 1989
Conference paperPhoton transport transistor
- B.J. Van Zeghbroeck
- C. Harder
- et al.
- 1989
- IEDM 1989
Conference paperLaser transfer of organic adsorbates: a test case using coronene surface patterns transferred with micrometer resolution to IR Windows
- M. DeVries
- H.E. Hunziker
- et al.
- 1989
- Proceedings of SPIE 1989
Conference paperLow resistance ohmic contacts to two-dimensional electron-gas structures by selective MOVPE
- P. Solomon
- A. Palevski
- et al.
- 1989
- IEDM 1989
Conference paperA new planarization technique, using a combination of RIE and chemical mechanical polish (CMP)
- B. Davari
- C. Koburger
- et al.
- 1989
- IEDM 1989
Conference paper