Publications

2 results at ICMTS 2008

Operational amplifier based test structure for transistor threshold voltage variation
- - Brian L. Ji
  - Dale J. Pearson
  - et al.
- 2008
- ICMTS 2008
Conference paper
CMOS latch metastability characterization at the 65-nm-technology node
- - Manjul Bhushan
  - Mark B. Ketchen
  - et al.
- 2008
- ICMTS 2008
Conference paper