A model for negative bias temperature instability in oxide and high κ pFETs
- Sufi Zafar
- 2007
- ICICDT 2007
Conference paper
Publications
6 results at ICICDT 2007
Leakage analysis for FinFET devices using self-consistent electro-thermal modeling
- Satish Kumar
- Rajiv V. Joshi
- et al.
- 2007
- ICICDT 2007
Conference paperImpact of SOI history effect on random data signals
- Keith A. Jenkins
- S. Kim
- et al.
- 2007
- ICICDT 2007
Conference paperProtecting big blue from rogue subatomic particles
- Ethan H. Cannon
- A.J. KleinOsowski
- et al.
- 2007
- ICICDT 2007
Conference paperSRAM yield sensitivity to supply voltage fluctuations and its implications on Vmin
- Rouwaida Kanj
- Rajiv Joshi
- et al.
- 2007
- ICICDT 2007
Conference paperHigh-performance device optimization and dual-VT technology options for doublegate FET
- Aditya Bansal
- Keunwoo Kim
- et al.
- 2007
- ICICDT 2007
Conference paper