Publications

2 results at IEEE ITC 2006

High-voltage and high-power PLL diagnostics using advanced cooling and emission images
- - Franco Stellari
  - Peilin Song
  - et al.
- 2006
- IEEE ITC 2006
Conference paper
Data analysis techniques for CMOS technology characterization and product impact assessment
- - Anne Gattiker
  - Manjul Bhushan
  - et al.
- 2006
- IEEE ITC 2006
Conference paper