Diagnosis meets physical failure analysis: How long can we succeed?
- Anne Gattiker
- 2004
- IEEE ITC 2004
Conference paper
Publications
4 results at IEEE ITC 2004
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- Phil Nigh
- Anne Gattiker
- 2004
- IEEE ITC 2004
Conference paperCMOS IC diagnostics using the luminescence of OFF-state leakage currents
- Stas Polonsky
- Keith A. Jenkins
- et al.
- 2004
- IEEE ITC 2004
Conference paperA novel scan chain diagnostics technique based on light emission from leakage current
- Peilin Song
- Franco Stellari
- et al.
- 2004
- IEEE ITC 2004
Conference paper