A novel integrated reliability test system for BEOL TDDB study
- Jifeng Chen
- Peilin Song
- et al.
- 2012
- ISTFA 2012
Conference paper
Publications
3 results at ISTFA 2012
Near-infrared photon emission spectroscopy trends in scaled SOI technologies
- Ulrike Kindereit
- Alan J. Weger
- et al.
- 2012
- ISTFA 2012
Conference paperAdvanced methods and software for enhancing analytical tools capabilities during chip diagnostic and characterization
- Franco Stellari
- Peilin Song
- 2012
- ISTFA 2012
Conference paper