Sacit M. Cetiner, Rudolph Tromp, et al.
ANS Annual Conference 2008
The emitted alpha particle energy distribution from solder bumps can show substantial surface emission which has a large impact on the modeled SEU rate. State-of-the art alpha-particle detectors are required to measure the low emissivity and energy distribution. © 2010 IEEE.
Sacit M. Cetiner, Rudolph Tromp, et al.
ANS Annual Conference 2008
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS
A.J. KleinOsowski, Ethan H. Cannon, et al.
IEEE TNS
David F. Heidel, Kenneth P. Rodbell, et al.
IEEE TNS