SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Conference paper
Publications
30 results for H. Tang
Anthology of the development of radiation transport tools as applied to single event effects
- R.A. Reed
- R.A. Weller
- et al.
- 2013
- IEEE TNS
PaperSelected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
PaperUltra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Paper32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
PaperStacked devices for SEU immune design
- Phil Oldiges
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE International SOI Conference 2010
Conference paperAlpha-particle emission energy spectra from materials used for solder bumps
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2010
- IEEE TNS
PaperModeling of alpha-induced single event upsets for 45 nm node SOI devices using realistic C4 and 3D circuit geometries
- Henry H. K. Tang
- Conal E. Murray
- et al.
- 2009
- IEEE TNS
PaperTechnologies to further reduce soft error susceptibility in SOI
- P. Oldiges
- R.H. Dennard
- et al.
- 2009
- IEDM 2009
Conference paperMulti-bit upsets in 65nm SOI SRAMs
- Ethan H. Cannon
- Michael S. Gordon
- et al.
- 2008
- IRPS 2008
Conference paper