Some experimental results on placement techniques
Maurice Hanan, Peter K. Wolff, et al.
DAC 1976
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Maurice Hanan, Peter K. Wolff, et al.
DAC 1976
Victor Valls, Panagiotis Promponas, et al.
IEEE Communications Magazine
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SPIE Advances in Semiconductors and Superconductors 1990
Joel L. Wolf, Mark S. Squillante, et al.
IEEE Transactions on Knowledge and Data Engineering