QALD-3: Multilingual question answering over linked data
Elena Cabrio, Philipp Cimiano, et al.
CLEF 2013
In this paper, we review the current status of single-event upsets caused by alpha-particles in IBM circuits and technology. While both alpha-particles and cosmic radiation can induce upsets, the alpha-particle-induced upset rate has become an increasingly important issue because alpha-particle- induced upsets are no longer limited to memory circuits. Latch circuits have become highly sensitive to alpha-particles. The alpha-particle-induced upset rate of latch circuits is one of the most critical issues for microprocessors requiring both high performance and high reliability. © Copyright 2008 by International Business Machines Corporation.
Elena Cabrio, Philipp Cimiano, et al.
CLEF 2013
Anupam Gupta, Viswanath Nagarajan, et al.
Operations Research
Xinyi Su, Guangyu He, et al.
Dianli Xitong Zidonghua/Automation of Electric Power Systems
Michael C. McCord, Violetta Cavalli-Sforza
ACL 2007