R.F. Broom, T. Mohr
Thin Solid Films
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
R.F. Broom, T. Mohr
Thin Solid Films
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Journal of Crystal Growth
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Journal of Crystal Growth
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