D.G. Schlom, D. Anselmetti, et al.
Zeitschrift für Physik B Condensed Matter
Characteristics of in-line Josephson gates have been computed, using numerical techniques, for a number of differing junction length to Josephson penetration depth ratios. These are verified by systematic experimental results, where the agreement between theory and experiment was found to be good. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
D.G. Schlom, D. Anselmetti, et al.
Zeitschrift für Physik B Condensed Matter
R.F. Broom, T. Mohr
Thin Solid Films
A. Catana, R.F. Broom, et al.
Journal of Crystal Growth
R.F. Broom, W. Jutzi, et al.
IEEE Transactions on Magnetics